Shows and Events
Upcoming Shows and Events
QED Technologies® participates in various domestic and international tradeshows. We hope that you will stop by one of our exhibits to learn more about the capabilities our MRF and SSI systems can offer. Additionally, we will be happy to meet with you individually. If you are interested, please let us know so that we can set-up a specific appointment.
September 4-7, 2013 - CIOE, Shenzhen China. Visit QED Technologies in booth 9P16.
September 10-12, 2013 - Photomask Technology, Monterey, California. QED Technologies' Paul Dumas will present "Ultra-low roughness magnetorheological finishing for EUV mask substrates". View the abstract here.
October 15-17, 2013 - Optifab, Rochester, New York. Visit QED Technologies and QED Optics in booths 515 and 511. Learn about our latest metrology system ASI(Q) and the newest addition to our Q-flex family of MRF precision polishing systems. Discover new applications you can address using MRF smart fluids. Challenges manufacturing precision optics? Visit QED Optics experts for help.
QED events during Optifab:
In Booth Product Demonstrations
Visit the QED booth #515 for a schedule of in booth demonstrations.
October 16, 8:00 - 8:20 a.m. Paper 8884-44 - "Optical design with orthogonal surface descriptions". Presented by Dr. Greg Forbes
October 16, 8:20 - 8:40 a.m. Paper 8884-45 - "Design of systems involving easily measurable aspheres". Presented by Dr. Paul Murphy
October 15, 10:00 - 10:20 a.m. Paper 8884-31 - "Improved averaging for non-null interferometry". Presented by Jon Fleig
October 15, 1:50 - 2:10 Paper 8884-34 - "Fabrication and metrology of high-precision freeform surfaces". Presented by Paul Dumas
October 14, 1:30 - 5:30 p.m. SC1039 - "Evaluating Aspheres for Manufacturability". Presented by Drs. Greg Forbes and Paul Murphy, and Paul Dumas of QED Technologies
October 16, 2:00 - 3:00 p.m. "Future of Metrology". Dr. Andrew Kulawiec will participate in this panel discussion
October 15, 11:30 a.m. QIS - "A Coherent Imaging Fizeau Interfermeter for Improved Stitching". Presented by Chuck McFee
October 16, 4:30 - 6:00 p.m.. "Improved MRF Spot Characterization with QIS Metrology". Presented by Sandi Westover, Christopher Hall, Michael DeMarco.
QED Open House - We invite you to visit QED Technologies on October 17, 2012 at 6:30 p.m. Come join us for light refreshments and learn more about the ASI(Q), QED's latest metrology innovation, and Q-flex, our latest MRF polishing system. You can also tour our QED Optics manufacturing facility. Dr. Greg Forbes also will be on hand to talk about the Forbes Polynomials for asphere and freeform characterization.
Japan Technical Seminar - QED is happy to host its 5th annual Technical Seminar in Tokyo, Japan in December 2012. Please email email@example.com for more information about this technical seminar.