A metrology powerhouse capable of measuring even extreme aspheric departures.
The QIS is a new interferometer completely designed, engineered and built by QED Technologies. It is optimized for stitching and gives customers the ability to measure more parts, with improved accuracy, speed and ease of use.
QIS now brings more capability than ever to QED’s metrology systems. QED’s QIS incorporates hardware and software features designed to enhance the performance of QED’s metrology products. The proprietary QIS coherent imaging system allows the user to obtain measurements with higher fringe densities and greater contrast. The advanced optical design of QIS reduces common errors, such as retrace and magnification errors. In addition, the greater focus travel provided by QIS allows for the measurement of parts with shorter radii than possible with a general purpose interferometer. QIS was also designed using the same software platform, QED.NET, as QED’s metrology and newest MRF systems, which enables seamless communications between systems. These features result in ease of use, efficient processing, increased accuracies and expanded capabilities.
QIS is available on the new ASI(Q) platform, or as a field upgrade to existing ASI and SSI-A platforms.